Microlease, in association with EMSCAN and Keysight Technologies invites you to attend a FREE one day seminar on EMC compliance testing. There is a choice of two locations and dates for you to choose from (see below).

WHAT’S ON OFFER?

  • Free entrance to the EMC compliance testing seminar
  • Free lunch / refreshments throughout the day
  • Learn all about EMC compliance testing
  • Meet, engage and network with industry experts from EMSCAN, Keysight and Microlease 

Spaces are limited so to avoid disappointment, register now for your FREE place!

We will contact you to confirm your place as soon as possible.

 
 
DATE & LOCATION
 
There are two separate locations and dates for you to choose from:
 

Location 1: Keysight UK, Unit 610, Wharfedale Road, Winnersh, Wokingham, West Berkshire RG41 5TP

Date : Nov 18th 2015, from 10.00am to 5:00pm

 

Location 2: National Space Centre, Exploration Drive, Leicester LE4 5NS

Date: Nov 19th 2015, from 10.00am to 5:00pm

Entrance to National Space Centre galleries included!

 

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EMC Measurement Seminar: Optimising Compliance and Diagnostic Testing

AGENDA:

9:30
- Registration and coffee

10:00 Streamline EMC Testing with Prescan Analysis Tools (Mark Terrien, EMC Business Manager, Keysight Technologies)

Abstract:  One important tool used to reduce EMC compliance and pre compliance test time is pre-scanning the device under test with a fast detector to identify suspect emissions prior to final measurement with weighted detectors. This paper explores amplitude and frequency accuracy issues associated with traditional EMC pre-scanning and discusses how analysis tools like spectrum analysis and IF monitoring can be used to improve pre-scan results, saving test time and enhancing final measurement result accuracy.
 
10:45 Tea & Coffee, Networking and Product Demonstrations
 
11:15 The world’s fastest high resolution scanning technique that can pinpoint emissions from inside an IC or microchip (Ruska Patton, Director Product Management, EMSCAN)

The very-near-field scanning method based on an array of probes provides real time visualization of the spatial distribution of emissions from PCBs but lack the ability to do very high resolution scanning. Single probe mechanically swept solutions can do very high resolution scanning but they are extremely slow. A new method that combines the array of sensors with mechanical motion combines the benefits of both techniques and provides the fastest high resolution scanning available. This presentation will show a working system that implements this combined technique and explain how the system is able to peer inside an IC and isolate the radiation from individual pins and wire bonds. Testing from real world PCBs with multiple sources of emission will be presented.
 
Designers who are integrating high speed ICs and are responsible for meeting emission targets should attend. This will also be of interest to chip manufacturers who want to ensure their products do not contribute to excessive emission in sample designs and in end-customer designs.
 
12:30 Lunch, Networking and Product Demonstrations

14:00 Improve EMC Compliance Testing Throughput with Time Domain Scanning (Mark Terrien, EMC Business Manager, Keysight Technologies)
 
Abstract:  Modern EMI compliance receivers and pre compliance analyzers offer Time Domain Scanning to reduce overall measurement time and improve test house efficiency.  This paper describes how Time Domain Scanning works and explores associated measurement issues and receiver design considerations.  With this information, users will have a better understanding of how to use this technology to improve their testing efficiency and test lab throughput.
 
15:00 Tea & Coffee, Networking and Product Demonstrations
 
15:00 EMC Clinic – On request & by appointment, bring your PCB/DUT for measurement insight. Click Here to register.
 
17:00 Close

This seminar is now over.

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